FM-Nanoview 1000 AFM Atomic Force Microscope

FM-Nanoview 1000 AFM Atomic Force Microscope

Scan head and sample stage are designed together, strong anti-vibration performance;Precision laser detection and probe alignment device make laser adjustment simple and easy;Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning;High-accuracy and large range sample transfer device allow to scan any interesting area of sample;Optical observation system for tip check and sample positioning;Electronic system is designed as modular and easy for maintenance and further development;Adopt spring for vibration isolation, simple and good performance.

Software

1. Two kinds of sampling pixel for choose: 256×256, 512×512;
2. Execute scan area move and cut function, choose any interesting area of sample;
3. Scan sample in random angle at beginning;
4. Adjust the laser spot detection system in real time;
5. Choose and set different color of scanning image in palette.
6. Support linear average and offset calibration in real time for sample title;
7. Support scanner sensitivity calibration and electronic controller auto-calibration;
8. Support offline analysis and process of sample image.

Main technical parameters