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FM-Nanoview 1000 AFM Atomic Force Microscope

Brand:NANBEI

Model:FM-Nanoview 1000 AFM

Application:

Product Introduction

 Scan head and sample stage are designed together, strong anti-vibration performance;Precision laser detection and probe alignment device make laser adjustment simple and easy;Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning;High-accuracy and large range sample transfer device allow to scan any interesting area of sample;Optical observation system for tip check and sample positioning;Electronic system is designed as modular and easy for maintenance and further development;Adopt spring for vibration isolation, simple and good performance.

Software

1. Two kinds of sampling pixel for choose: 256×256, 512×512;
2. Execute scan area move and cut function, choose any interesting area of sample;
3. Scan sample in random angle at beginning;
4. Adjust the laser spot detection system in real time;
5. Choose and set different color of scanning image in palette.
6. Support linear average and offset calibration in real time for sample title;
7. Support scanner sensitivity calibration and electronic controller auto-calibration;
8. Support offline analysis and process of sample image.

Main technical parameters

Item

Technical data

Item

Technical data

Operation modes

Contact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.

Scan angle

Random

Sample size

Φ≤90mm,H≤20mm

Sample movement

0~20mm

Max. scan range

X/Y: 20 um, Z: 2 um

Pulse width of approaching  motor

10±2ms

Resolution

X/Y: 0.2 nm, Z: 0.05nm

Optical system

Magnification: 4X, resolution: 2.5 um

Scan rate

0.6Hz~4.34Hz

Data points

256×256,512×512

Scanning control

XY18-bit D/A, Z: 16-bit D/A

Feedback type

DSP digital feedback

Data sampling

One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously 

Feedback sampling rate

64.0KHz

PC connection

USB2.0

Windows

Compatible with Windows98/2000/XP/7/8

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